abstract
In this contribution we present a novel approach to analyze impedance spectroscopy measurements of supercapacitors. Transforming the impedance data into frequency-dependent capacitance allows us to use Impedance Spectroscopy Genetic Programming (ISGP) in order to find the distribution function of relaxation times (DFRT) of the processes taking place in the tested device. Synthetic data was generated in order to demonstrate this technique and a model for supercapacitor ageing process has been obtained.